MicroApps Schedule

Traditional spring-loaded contacting solutions for the production-line test of electronic components have several advantages over connector based contacting solutions, but with ever-increasing demands for frequency performance, such connections also have several drawbacks. We describe how to overcome these drawbacks and how to successfully use spring-loaded components for functional-testing of RF-applications.

High-end Vector Network Analyzers have always been instruments with unrivaled accuracy and defined measurement uncertainty. During the last decade, general-purpose Vector Network Analyzers have morphed into precision instruments for most demanding measurements. This talk will describe architectural advances and engineering breakthroughs enabling unknown levels of accuracy for general-purpose instruments.

Describe and demonstrate calibration technique using Micro-Mode's patent pending SMPM and MSSS calibration kit.

Copper Mountain Technologies’ VNAs are used for various test and measurement applications. A fundamental requirement of most test systems is to have a good RF coaxial cable. The purpose of this seminar is to focus on how to test a cable accurately using an ACM.

Power Sensors are a common tool around every RF and Microwave lab, but understanding what is being measured, and all the factors that influence the uncertainty (or accuracy) of a given measurement can be a confusing and overwhelming task. This tutorial will show how to overcome limitations of traditional sensors

Spatial and temporal resolution of thermoreflectance-based imaging has established it as an effective technique for thermal analysis of GaN HEMTs. We describe developments in this analysis technique to meet increased thermal challenges with these devices with focus on gaining better understanding of thermal behavior in the 2D electron gas channel.

New techniques to increase dynamic range of 4G/5G test requirement are shown. Useful Block diagrams of set-ups including real test data are presented.

Discussions of RF Detector ICs typically focus on input frequency range, input power range and input sensitivity. While these specifications are critical, less attention is given to output referred specifications such as output frequency response, output flatness vs input frequency, pulse response and output drive capability. In this Microapps session, we will focus on these RF detector specifications and how they impact the systems in which they are used.

AFR is used to rapidly de-embed, from helium to room temperature, the long coaxial transmission lines and microwave probes from a cryogenic, wafer-level prober. For many measurements, cryo-AFR eliminates manual movement of probes from calibration substrate to DUT at every temperature and frees valuable cold-stage space for larger sample wafers.

Many communication systems operate at very low levels (i.e. <-100 dBm). They are integrated in PCBs/enclosures where other systems can create EMI affecting signal reception. If noise level is very low/intermittent, the problem is hard to measure/locate.
Near-field scanners (150kHz-8GHz) can be useful in debugging self-interference and intra-equipment EMI problems.

Everyone is talking about 5G and higher signal bandwidth in microwave frequencies to increase data throughput. Various field trials help understanding the new environment. Component suppliers need to provide capable building blocks enabling 5G. This paper provides an overview of the relevant changes and trends to address them.

In this paper, we will discuss typical configuration of the beamformer IC in 5G system that includes power amplifier, low noise amplifier, phase shifter, and switch. We will also address test parameters of the IC such as phase alignment, non-linearity, and noise figure. Key considerations for testing such device, for example, signal routing, power handling, and signal conditioning will be discussed and finally we will introduce our solution with PNA-X and testset.

Emerging technologies like 5G operate anywhere from 28GHz-to-60 GHz. Delivering high volume, low cost devices at these frequencies is challenging, and so is testing. This paper presents a new approach to RF-Measurements that will simplify testing at these frequencies while still enabling complex features like Beam-Forming transmitters to be tested.

Historically on-wafer microwave and millimeter-wave vector network analyzer device characterization has been a process requiring operator attention almost continuously. We will reveal recent enhancements to our probing systems that allow full automation of VNA calibration and device measurement.

Noise XT has developed a new Phase Noise Analyzer capable of measuring both Phase and Amplitude Noise with a blazing speed of 244,000 averages per second. Now all State of the Art oscillators can be measured during the manufacturing process in a matter of seconds improving final customer satisfaction.

Noise-Figure is key for low-noise amplifiers and low-noise receiver front ends. Results are used along with s-parameters, compression-characteristics and intermodulation-performance during all phases of design, verification, and production enabling decisions about performance vs. cost vs. yield. The desire is to make all measurements with a single connection to the device-under-test.

This paper will describe how RF designers use Load pull and Noise parameter extraction tools to design for millimetre wave applications. The 5G standard has yet to be finalized, yet device and power amplifier designers are tasked with testing these high frequency linear and non linear devices.

Phase coherent RF and microwave signals are required in many applications like massive MIMO, beamforming, radar, etc. In particular, phase stability between the signals is critical. Generating such signals in a reliable and repeatable manner has long been a challenge. A configuration for wideband phase coherent signal generation is presented.

For traditional wireless communication systems it is important to get an understanding of the wireless link. This requires the ability to test and understand system operation with an Over The Air (OTA) link, the various variables that come into play in defining acceptable system performance and exercising the system with various environmental variables. The reality of the channel impairment may not always be understood, apparent or overlooked in the theoretical model and consequently testing with a real OTA link is an important step to understanding the limitations of the system.

Spurious emission search is a demanding measurements of RF/microwave devices. We will review the basics of spurious measurements with spectrum analyzers and how parameters can affect the system performance. We cover traditional methods and introduce new techniques that provide better usability and speed, especially when searching low level spurious signals.

Automotive FMCW-radars operate between 76GHz and 77GHz. Up to 81GHz has become available in some countries. Distance-resolution is proportional to signal-bandwidth and manufacturers are developing FMCW-radars with wider bandwidths. Signal-linearity and chirp duration also determine performance and it is important to analyze all parameters including chirp-length, -rate, frequency deviation, etc.

FormFactor, Inc. is a recognized leader in RF/Microwave performance of analytic probes in our Infinity and ACP lines of probes. We also produce fully customized probe cards for on-wafer device production testing. We'll show a detailed performance comparison of these probing solutions across frequencies up to and above 80GHz.

With increasing data-rates, system-jitter-budgets get tighter. This calls for lower jitter limits of key components like clock sources and traditional scope-based-measurements get to their limits. We will look at modern ways to analyze the real jitter performance of clocks, even when the clock runs in spread spectrum clocking (SSC) mode.

In response to demands for high quality 1.0 mm connectors; Signal Microwave and Isola partnered to develop 110 GHz boards and 1.0 mm connectors. Isola formulated a high performance laminate presenting low dielectric loss. Simultaneously, Signal Microwave designed a 1.0 mm edge launch connector exhibiting low reflections. This presentation will highlight the connector design, board formulation, and testing.

Devices enabled with GPS are everywhere, and end-user demands have moved to knowing 'where I am, all the time, and what direction am I facing'. Multiple antennas feeding the same receiver can achieve that. We'll discuss different models for multi-antenna GPS testing and how to overcome many complex challenges

Modern radio-communication-systems regularly employ frequency-hopping methods to suppress interference or prevent fading. However, frequency-hopping also influences data-throughput, thus requiring quick frequency-settling. Complex test-setups were necessary to determine settling time of a frequency hop.
A new generation of signal analyzers now measures settling procedures with less effort and provides rapid results.

With the ever increasing complexity and wide band nature of new modulation schemes employed in communications systems it is more important than ever to fully understand the performance of a front end module under realistic operating conditions.

Measuring pulse-to-pulse phase stability in modern RADAR is very important for range and velocity resolution. Very low phase noise of the local oscillator is needed to achieve the required performance. However, two-port-devices like amplifiers can deteriorate the performance.
We measure and quantify the variability of pulse parameters over time.