Built-in-Self-Test Methods for Phased-Array Beamforming ICs

UCSD has developed several techniques for built-in-self-test with excellent results, from 10 GHz to 100 GHz. These techniques can measure the Gain and Phase states for every channel, in both the Tx and Rx modes, and can also determine the absolute gain of a chip without the need for any external probes. We have also developed BIST circuits which are accurate for narrowband systems (+/-20%) and some which can cover 2-16 GHz and larger bands. The talk will present recent work in the BIST field.